GaN & Wide-Bandgap Semiconductors

Piezoelectric quantum noise and reliability in nitride devices

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GaN & Wide-Bandgap Semiconductor Devices

Handel made pioneering contributions to understanding and optimizing noise, reliability, and performance in GaN-based heterostructure devices, particularly High Electron Mobility Field Effect Transistors (HEMTs/HFETs) for RF power amplifiers and high-frequency electronics. Through extensive collaborations with Hadis Morkoç and others from 2000-2013, Handel developed comprehensive theoretical frameworks for piezoelectric quantum 1/f noise in GaN/AlGaN heterostructures, showing how strain-induced polarization fields and crystal structure uniquely affect noise generation in nitride semiconductors.

His research fundamentally changed GaN device development by establishing that 1/f noise measurements serve as diagnostic windows into device stability and reliability, enabling non-destructive prediction of degradation and failure modes. This work provided the theoretical foundation for optimizing device geometry, material quality, and operating conditions to minimize phase noise in oscillators and maximize sensitivity in detectors, directly enabling the revolution in GaN-based power amplifiers, radar systems, and 5G wireless infrastructure.

Key Publications

#195
Quantum 1/f Noise in GaN Materials and Devices
P.H. Handel
WOCSDICE 2000 Conference Proceedings
#199
Quantum 1/f Noise in GaN/Al0.15Ga0.85N Doped Channel HFETs
P.H. Handel
8th van der Ziel Symposium, St. Louis (2000)
#209
Quantum 1/f Noise in GaN/AlGaN HFET's and Phase Noise in RTDs
P.H. Handel
WOCSDICE 2001, Sardinia
#214
Quantum 1/f Noise in Epitaxial Lateral Overgrown GaN: Piezoelectric Effect
E.K. Sia, S.J. Chua, H.L. Hartnagel, P.H. Handel
Semiconductor Science and Technology 17, 617-620 (2002)
#223
Quantum 1/f Noise in GaN/AlGaN HEFTs and Other Nanodevices
P.H. Handel, S. Lin, U.K. Mishra, L. Shen
ICNF'03, Prague
#226
1/f Noise Measurement and Theory in GaN HEFTs, Other Devices and Systems
P.H. Handel, S. Lin
WOCSDICE 2003
#232
GaN HEMT Geometry and Piezoelectric Quantum 1/f Noise
P.H. Handel, H.L. Hartnagel, K.E. Sia, U.K. Mishra, R. York
WOCSDICE 2004
#238
1/f Noise in GaN/AlGaN HFET Based Oscillators
P.H. Handel, A.G. Tournier, H.L. Hartnagel, U.K. Mishra, R. York
Cardiff University Press (2005)
#239
Quantum 1/f Phase Noise in GaN/AlGaN HFET Based Oscillators
P.H. Handel, A.G. Tournier, H.L. Hartnagel, U.K. Mishra, R. York
Cardiff University Press (2005)
#254
Quantum 1/f Noise in GaN FETs, MODFETs, and their Oscillators' Phase Noise (Invited)
P.H. Handel, A.M. Hall, H. Morkoç
SPIE Conf. 6473 (2007)
#255
1/f Noise in the Dark Current of GaN QWIPs
A.M. Hall, P.H. Handel
SPIE Conf. 6473 (2007)
#262
Use of Quantum 1/f Noise Formulas in the Reliability Characterization of Nitride-Based Heterostructures
P.H. Handel, H. Morkoç, A.M. Truong
SPIE Vol. 6894 (2008)
#263
Piezoelectric Quantum 1/f Noise in Nitride-Based Heterostructures (Invited)
P.H. Handel, H. Morkoç, Enkee Sia, A.M. Truong
SPIE Vol. 6894 (2008)
#264
1/f Noise in Nitride-Based Spintronic Devices
P.H. Handel, A.M. Truong
SPIE Vol. 6894 (2008)
#272
Piezoelectric Quantum 1/f Noise in AlGaN HFETs and Reliability
P.H. Handel, H. Morkoç
SPIE Vol. 7216 (2009)
#279
1/f Noise: A Window to HFET Stability
P.H. Handel, T. Sherif, C. Kayis, J. Leach, C. Zhu, H. Morkoç
SPIE-PW'10
#291
Low-frequency Noise Measurements of AlGaN/GaN MOS HFETs with HfAlO Gate Dielectric
C. Kayis, J.H. Leach, C.Y Zhu, M. Wu, X. Li, Ü. Özgür, H. Morkoç, X. Yang, V. Misra, P.H Handel
IEEE Electron Device Letters Vol. 31, 1041-1043 (2010)